From 9a4a122e6ac48d39cca95ada5e0528c2940d1ca5 Mon Sep 17 00:00:00 2001 From: kai-morich Date: Sat, 26 Oct 2019 08:34:47 +0200 Subject: [PATCH] Updated Device Tests & Coverage Report (markdown) --- Device-Tests-&-Coverage-Report.md | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/Device-Tests-&-Coverage-Report.md b/Device-Tests-&-Coverage-Report.md index 5979709..2ddef43 100644 --- a/Device-Tests-&-Coverage-Report.md +++ b/Device-Tests-&-Coverage-Report.md @@ -1,7 +1,7 @@ Only a subset of this library can be tested reasonably with unit tests. Mocking the serial converter chips would hardly represent their real behavior, so I decided to use tests on real devices where the device is connected to: * Android executing [Android instrumented test](https://developer.android.com/training/testing/unit-testing/instrumented-unit-tests)s -* Windows/Linux host running a [RFC-2217](https://tools.ietf.org/html/rfc2217) server +* Windows/Linux host with a real serial port running a [RFC-2217](https://tools.ietf.org/html/rfc2217) server The instrumented test uses the RFC-2217 server to control the other end of the serial line over Wi-Fi.