tests: add more test descriptions

Add more test descriptions based on exiting comments.

Signed-off-by: Thomas Wood <thomas.wood@intel.com>
This commit is contained in:
Thomas Wood
2014-11-28 11:02:44 +00:00
parent 029dee7979
commit b2ac2642a9
66 changed files with 167 additions and 4 deletions
+3
View File
@@ -58,6 +58,9 @@
#include "intel_io.h"
#include "igt_aux.h"
IGT_TEST_DESCRIPTION("Test doing many tiled blits, with a working set larger"
" than the aperture size.");
static drm_intel_bufmgr *bufmgr;
struct intel_batchbuffer *batch;
static int width = 512, height = 512;