tests: add more test descriptions

Add more test descriptions based on exiting comments.

Signed-off-by: Thomas Wood <thomas.wood@intel.com>
This commit is contained in:
Thomas Wood
2014-11-28 11:02:44 +00:00
parent 029dee7979
commit b2ac2642a9
66 changed files with 167 additions and 4 deletions
+2
View File
@@ -34,6 +34,8 @@
#include "ioctl_wrappers.h"
#include "intel_bufmgr.h"
IGT_TEST_DESCRIPTION("Check parallel access to tiled memory.");
/* Testcase: check parallel access to tiled memory
*
* Parallel access to tiled memory caused sigbus