tests: add more test descriptions

Add more test descriptions based on exiting comments.

Signed-off-by: Thomas Wood <thomas.wood@intel.com>
This commit is contained in:
Thomas Wood
2014-11-28 11:02:44 +00:00
parent 029dee7979
commit b2ac2642a9
66 changed files with 167 additions and 4 deletions
+3
View File
@@ -51,6 +51,9 @@
#include "intel_io.h"
#include "intel_chipset.h"
IGT_TEST_DESCRIPTION("Runs blitcopy -> rendercopy with multiple buffers over"
" wrap boundary.");
static int devid;
static int card_index = 0;
static uint32_t last_seqno = 0;