tests: add more test descriptions

Add more test descriptions based on exiting comments.

Signed-off-by: Thomas Wood <thomas.wood@intel.com>
This commit is contained in:
Thomas Wood
2014-11-28 11:02:44 +00:00
parent 029dee7979
commit b2ac2642a9
66 changed files with 167 additions and 4 deletions
+3
View File
@@ -50,6 +50,9 @@
#include "intel_io.h"
#include "igt_aux.h"
IGT_TEST_DESCRIPTION("Test doing many blits with a working set larger than the"
" aperture size.");
#define WIDTH 512
#define HEIGHT 512