tests: add more test descriptions

Add more test descriptions based on exiting comments.

Signed-off-by: Thomas Wood <thomas.wood@intel.com>
This commit is contained in:
Thomas Wood
2014-11-28 11:02:44 +00:00
parent 029dee7979
commit b2ac2642a9
66 changed files with 167 additions and 4 deletions
+3
View File
@@ -49,6 +49,9 @@
#include "intel_chipset.h"
#include "igt_aux.h"
IGT_TEST_DESCRIPTION("Run a couple of big batches to force the unbind on"
" misalignment code.");
#define HEIGHT 256
#define WIDTH 1024