tests: add more test descriptions

Add more test descriptions based on exiting comments.

Signed-off-by: Thomas Wood <thomas.wood@intel.com>
This commit is contained in:
Thomas Wood
2014-11-28 11:02:44 +00:00
parent 029dee7979
commit b2ac2642a9
66 changed files with 167 additions and 4 deletions
+2
View File
@@ -47,6 +47,8 @@
#include "intel_io.h"
#include "intel_chipset.h"
IGT_TEST_DESCRIPTION("Basic test for memory and refcount leaks.");
/* options */
int num_contexts = 10;
int uncontexted = 0; /* test only context create/destroy */